Electrophysical Properties along the Interface of Two Polymer Films of Polymethylmethacrylate

• Published in: Physics of the solid state Vol. 63; no. 4; pp. 577 - 581
• Main Authors: Lachinov, A. N., Altynshina, G. R., Baibulova, G. Sh, Kian, M. F., Yusupov, A. R.
• Format: Journal Article
• Language: English
• Published: Moscow Pleiades Publishing 01.04.2021; Springer; Springer Nature B.V
• Subjects: Carrier mobility; Comparative analysis; Comparative studies; Current carriers; Current voltage characteristics; Dielectric films; Dielectrics; Electric contacts; Electric properties; Electrical conductivity; Electrical resistivity; Physics; Physics and Astronomy; Polymer films; Polymers; Polymethylmethacrylate; Solid State Physics; Thickness; Thin films; mobility; polymethylmethacrylate; interface; dielectric films
• ISSN: 1063-7834; 1090-6460
• DOI: 10.1134/S1063783421040120

The electrical conductivity is studied along the interface between dielectric films of submicrometer thicknesses. The results of the comparative study of the electrophysical properties of the individual films are presented. A commercial polymer polymethylmetacrylate is used as the dielectric material. The studies have been performed by the two-probe scheme using the method of current–voltage characteristics. The conductivity is found to anomalously increase with respect to the bulk conductivity. The increase in the conductivity is established to be related to an increase in the charge carrier mobility along the interface to 140 cm 2 /V s. The results are compared with the data for known analogs; it is noted that additional study of the properties of a 3D region/2D region contact is necessary.