Nanoscale optical microscopy in the vectorial focusing regime

• Published in: 2008 Conference on Lasers and Electro-Optics and 2008 Conference on Quantum Electronics and Laser Science Vol. 2; no. 5; pp. 311 - 314
• Main Authors: Serrels, K.A., Ramsay, E., Warburton, R.J., Reid, D.T.
• Format: Conference Proceeding Journal Article
• Language: English
• Published: London IEEE 01.05.2008; Nature Publishing Group UK; Nature Publishing Group
• Subjects: (180.4315) Nonlinear Microscopy; (350.5730) Resolution; Applied and Technical Physics; Conventional optical microscopes; Exact sciences and technology; Fundamental areas of phenomenology (including applications); High-resolution imaging; Image resolution; Imaging and optical processing; Instruments, apparatus, components and techniques common to several branches of physics and astronomy; Lenses; Lenses, prisms, and mirrors; letter; Light microscopy; Nonlinear optics; Optical elements, devices, and systems; Optical imaging; Optical instruments, equipment and techniques; Optical microscopy; Optical polarization; Optical refraction; Optics; Physics; Physics and Astronomy; Quantum Physics; Silicon; Ultrafast optics; Focal planes; Data acquisition systems; Polarized beams; Solid immersion lens; Imagery; Integrated circuits; Numerical aperture; Optical microscopy; Optical polarization; Intensity distribution; Optical focusing; Silicon; Spatial resolution
• ISBN: 1557528594; 9781557528599
• ISSN: 1749-4885; 1749-4893
• DOI: 10.1038/nphoton.2008.29

By using extreme numerical-aperture solid-immersion microscopy at 1553 nm we demonstrate, under certain circumstances, polarization-sensitive imaging with resolution values approaching 100 nm which substantially surpass the classical scalar diffraction-limit embodied by Sparrowpsilas resolution criterion.