Rough surface scattering in many-mode conducting channels: gradient versus amplitude scattering

• Published in: Physica Status Solidi (b) Vol. 242; no. 6; pp. 1224 - 1228
• Main Authors: Izrailev, F. M., Makarov, N. M., Rendón, M.
• Format: Journal Article Conference Proceeding
• Language: English
• Published: Berlin WILEY-VCH Verlag 01.05.2005; WILEY‐VCH Verlag; Wiley
• Subjects: 05.45.Mt; 41.20.Jb; 42.25.Dd; 71.23.An; Exact sciences and technology; Physics; Electron scattering; Mean free path; Microwave radiation; Surface scattering; Roughness; Transport processes; Rough surfaces
• ISSN: 0370-1972; 1521-3951
• DOI: 10.1002/pssb.200460769

We study transport properties of many‐mode electron waveguides paying the main attention to the interplay between the amplitude and gradient scattering from rough surfaces. Our analysis shows that the two types of scattering are governed by different control parameters. The first (common) parameter is the ratio of the roughness amplitude to the transverse average width of a waveguide. The second parameter is determined by the squared derivative of a surface profile. We have found that the latter parameter can play the major role in the expression for the inverse mean free path, in contrast to all previous studies where the square‐gradient terms were neglected. Our results may be used in experimental realizations of the surface scattering of electron waves, as well as in other applications (e.g., for optical and microwave waveguides). (© 2005 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)