Quantum metrology

We point out a general framework that encompasses most cases in which quantum effects enable an increase in precision when estimating a parameter (quantum metrology). The typical quantum precision enhancement is of the order of the square root of the number of times the system is sampled. We prove t...

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Bibliographic Details
Published inPhysical review letters Vol. 96; no. 1; p. 010401
Main Authors Giovannetti, Vittorio, Lloyd, Seth, Maccone, Lorenzo
Format Journal Article
LanguageEnglish
Published United States 13.01.2006
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Summary:We point out a general framework that encompasses most cases in which quantum effects enable an increase in precision when estimating a parameter (quantum metrology). The typical quantum precision enhancement is of the order of the square root of the number of times the system is sampled. We prove that this is optimal, and we point out the different strategies (classical and quantum) that permit one to attain this bound.
ISSN:0031-9007
1079-7114
DOI:10.1103/PhysRevLett.96.010401