Polarization effects and tests for crystalline silicon solar cells

We try to find a fast and simple potential induced degradation effect （PID） test procedure for crystalline silicon solar cells. With sodium chloride （NaC1） solution as Na＋ source, PVB as lamination material, we can carry out the test in 1 h. Solar cells with newly developed PID resistance process we...

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Bibliographic Details
Published inJournal of semiconductors Vol. 36; no. 9; pp. 9 - 14
Main Author 鲁伟明 王志刚 胡辉
Format Journal Article
LanguageEnglish
Published Chinese Institute of Electronics 01.09.2015
Subjects
Crystal structure
crystalline silicon solar cells
NaCl
Photovoltaic cells
Polarization
potential induced degradation
rapid test
Semiconductors
Silicon
Sodium chloride
Solar cells
反向电流
层压材料
晶体硅太阳能电池
极化效应
标准程序
测试程序
降解效应
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ISSN1674-4926
DOI10.1088/1674-4926/36/9/092002

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Summary:We try to find a fast and simple potential induced degradation effect （PID） test procedure for crystalline silicon solar cells. With sodium chloride （NaC1） solution as Na＋ source, PVB as lamination material, we can carry out the test in 1 h. Solar cells with newly developed PID resistance process were also tested. The increase of reverse current of solar cell can be considered a key standard to determine if the solar cell was prone to PID. Moreover, it showed that the increase of reverse current for the PID resistance solar cell was less than 2. In addition, the test results of the solar cells fitted very well with that of the modules by standard procedure.
Bibliography:11-5781/TN
We try to find a fast and simple potential induced degradation effect （PID） test procedure for crystalline silicon solar cells. With sodium chloride （NaC1） solution as Na＋ source, PVB as lamination material, we can carry out the test in 1 h. Solar cells with newly developed PID resistance process were also tested. The increase of reverse current of solar cell can be considered a key standard to determine if the solar cell was prone to PID. Moreover, it showed that the increase of reverse current for the PID resistance solar cell was less than 2. In addition, the test results of the solar cells fitted very well with that of the modules by standard procedure.
crystalline silicon solar cells; potential induced degradation; rapid test
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SourceType-Scholarly Journals-1
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content type line 23
ISSN:1674-4926
DOI:10.1088/1674-4926/36/9/092002