A digital CDS technique and its performance testing
Readout noise is a critical parameter for characterizing the performance of charge-coupled devices(CCDs), which can be greatly reduced by the correlated double sampling(CDS) circuit. However, a conventional CDS circuit inevitably introduces new noise since it consists of several active analog compon...
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Published in | Chinese physics C Vol. 39; no. 7; pp. 48 - 52 |
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Main Author | |
Format | Journal Article |
Language | English |
Published |
United States
IOP Publishing
01.07.2015
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Subjects | |
Online Access | Get full text |
ISSN | 1674-1137 0254-3052 |
DOI | 10.1088/1674-1137/39/7/076101 |
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Summary: | Readout noise is a critical parameter for characterizing the performance of charge-coupled devices(CCDs), which can be greatly reduced by the correlated double sampling(CDS) circuit. However, a conventional CDS circuit inevitably introduces new noise since it consists of several active analog components such as operational amplifiers. This paper proposes a digital CDS circuit technique, which transforms the pre-amplified CCD signal into a train of digital presentations by a high-speed data acquisition card directly without the noisy CDS circuit,then implements the digital CDS algorithm through a numerical method. A readout noise of 3.3 e- and an energy resolution of 121 e V@5.9 ke V can be achieved via the digital CDS technique. |
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Bibliography: | Readout noise is a critical parameter for characterizing the performance of charge-coupled devices(CCDs), which can be greatly reduced by the correlated double sampling(CDS) circuit. However, a conventional CDS circuit inevitably introduces new noise since it consists of several active analog components such as operational amplifiers. This paper proposes a digital CDS circuit technique, which transforms the pre-amplified CCD signal into a train of digital presentations by a high-speed data acquisition card directly without the noisy CDS circuit,then implements the digital CDS algorithm through a numerical method. A readout noise of 3.3 e- and an energy resolution of 121 e V@5.9 ke V can be achieved via the digital CDS technique. charge-coupled devices,readout noise,correlated double sampling 11-5641/O4 LIU Xiao-Yan LU Jing-Bin YANG Yan-Ji LU Bo WANG Yu-Sa XU Yu-Peng CUI Wei-Wei LI Wei LI Mao-Shun WANG Juan HAN Da-Wei CHEN Tian-Xiang HUO Jia HU Wei ZHANG Yi ZHU Yue ZHANG Zi-Liang YIN Guo-He WANG Yu ZHAO Zhong-Yi FU Yan-Hong ZHANG Ya MA Ke-Yan CHEN Yong( 1 College of Physics, Jilin University, No.2699, Qianjin Road, Changchun 130023, China 2 Key Laboratory of Particle Astrophysics, Institute of High Energy Physics, Chinese Academy of Sciences, 19B Yuquan Road, Beijing 100049, China 3 School of Physical Science and Technology, Yunnan University, Cuihu North Road 2, Kunming 650091, China) ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 23 National Natural Science Foundation of China (NSFC) AC02-05CH11231 USDOE Office of Science (SC) |
ISSN: | 1674-1137 0254-3052 |
DOI: | 10.1088/1674-1137/39/7/076101 |