A digital CDS technique and its performance testing

Readout noise is a critical parameter for characterizing the performance of charge-coupled devices(CCDs), which can be greatly reduced by the correlated double sampling(CDS) circuit. However, a conventional CDS circuit inevitably introduces new noise since it consists of several active analog compon...

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Published inChinese physics C Vol. 39; no. 7; pp. 48 - 52
Main Author 刘晓艳 陆景彬 杨彦佶 陆波 王于仨 徐玉朋 崔苇苇 李炜 李茂顺 王娟 韩大炜 陈田祥 霍嘉 胡渭 张艺 朱玥 张子良 尹国和 王宇 赵仲毅 付艳红 张娅 马克岩 陈勇
Format Journal Article
LanguageEnglish
Published United States IOP Publishing 01.07.2015
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ISSN1674-1137
0254-3052
DOI10.1088/1674-1137/39/7/076101

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Summary:Readout noise is a critical parameter for characterizing the performance of charge-coupled devices(CCDs), which can be greatly reduced by the correlated double sampling(CDS) circuit. However, a conventional CDS circuit inevitably introduces new noise since it consists of several active analog components such as operational amplifiers. This paper proposes a digital CDS circuit technique, which transforms the pre-amplified CCD signal into a train of digital presentations by a high-speed data acquisition card directly without the noisy CDS circuit,then implements the digital CDS algorithm through a numerical method. A readout noise of 3.3 e- and an energy resolution of 121 e V@5.9 ke V can be achieved via the digital CDS technique.
Bibliography:Readout noise is a critical parameter for characterizing the performance of charge-coupled devices(CCDs), which can be greatly reduced by the correlated double sampling(CDS) circuit. However, a conventional CDS circuit inevitably introduces new noise since it consists of several active analog components such as operational amplifiers. This paper proposes a digital CDS circuit technique, which transforms the pre-amplified CCD signal into a train of digital presentations by a high-speed data acquisition card directly without the noisy CDS circuit,then implements the digital CDS algorithm through a numerical method. A readout noise of 3.3 e- and an energy resolution of 121 e V@5.9 ke V can be achieved via the digital CDS technique.
charge-coupled devices,readout noise,correlated double sampling
11-5641/O4
LIU Xiao-Yan LU Jing-Bin YANG Yan-Ji LU Bo WANG Yu-Sa XU Yu-Peng CUI Wei-Wei LI Wei LI Mao-Shun WANG Juan HAN Da-Wei CHEN Tian-Xiang HUO Jia HU Wei ZHANG Yi ZHU Yue ZHANG Zi-Liang YIN Guo-He WANG Yu ZHAO Zhong-Yi FU Yan-Hong ZHANG Ya MA Ke-Yan CHEN Yong( 1 College of Physics, Jilin University, No.2699, Qianjin Road, Changchun 130023, China 2 Key Laboratory of Particle Astrophysics, Institute of High Energy Physics, Chinese Academy of Sciences, 19B Yuquan Road, Beijing 100049, China 3 School of Physical Science and Technology, Yunnan University, Cuihu North Road 2, Kunming 650091, China)
ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 23
National Natural Science Foundation of China (NSFC)
AC02-05CH11231
USDOE Office of Science (SC)
ISSN:1674-1137
0254-3052
DOI:10.1088/1674-1137/39/7/076101