Toward tunable thin-film filters for wavelength division multiplexing applications

We provide a detailed analysis of the various problems connected with the development of tunable thin-film filters for wavelength-division multiplexing applications. We examine the relation between the change in layer thickness and the central wavelength shift for various configurations and point ou...

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Bibliographic Details
Published inApplied optics (2004) Vol. 41; no. 16; p. 3277
Main Authors Lequime, Michel, Parmentier, Remy, Lemarchand, Fabien, Amra, Claude
Format Journal Article
LanguageEnglish
Published United States 01.06.2002
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Summary:We provide a detailed analysis of the various problems connected with the development of tunable thin-film filters for wavelength-division multiplexing applications. We examine the relation between the change in layer thickness and the central wavelength shift for various configurations and point out the significance of the structure of the reflectors, the spacer thickness, and the location of the active layers. We describe and compare practical arrangements using either temperature or an electric field as the driving parameter.
ISSN:1559-128X
DOI:10.1364/ao.41.003277