The rosetta experiment: atmospheric soft error rate testing in differing technology FPGAs

• Published in: IEEE transactions on device and materials reliability Vol. 5; no. 3; pp. 317 - 328
• Main Authors: Lesea, A., Drimer, S., Fabula, J.J., Carmichael, C., Alfke, P.
• Format: Magazine Article
• Language: English
• Published: New York IEEE 01.09.2005; The Institute of Electrical and Electronics Engineers, Inc. (IEEE); Institute of Electrical and Electronics Engineers
• Subjects: Circuit simulation; Circuit testing; Circuits; CMOS; CMOS technology; Cosmic rays; Cyclotrons; Devices; Electronics; Engineering Sciences; Error analysis; Field programmable gate arrays; FPGA; Laboratories; Neutrons; NSEU; Particle beams; Proton beams; Real time; Simulation; Single event transient; single-event upset; soft error; Soft errors; SRAM
• ISSN: 1530-4388; 1558-2574
• DOI: 10.1109/TDMR.2005.854207

Results are presented from real-time experiments that evaluated large field programmable gate arrays (FPGAs) fabricated in different CMOS technologies (0.15 /spl mu/m, 0.13 /spl mu/m, and 90 nm) for their sensitivity to radiation-induced single-event upsets (SEUs). These results are compared to circuit simulation (Qcrit) studies as well as to Los Alamos Neutron Science Center (LANSCE) neutron beam results and Crocker Nuclear Laboratory (University of California, Davis) cyclotron proton beam results.