Measurement of 3D Printed Structure Using a Peak Detection Method in Dispersive Interferometry

• Published in: Journal of electronic materials Vol. 44; no. 3; pp. 792 - 796
• Main Authors: Kim, Jongheon, Jo, Taeyong, Kim, Namyoon, Kwon, Dongil
• Format: Journal Article
• Language: English
• Published: Boston Springer US 01.03.2015; Springer Nature B.V
• Subjects: 3-D printers; Characterization and Evaluation of Materials; Chemistry and Materials Science; Electronics; Electronics and Microelectronics; Instrumentation; Interferometry; Materials Science; Measurement techniques; Optical and Electronic Materials; Solid State Physics; shape measurement; 3D measurement; Dispersive Interferometry; 3D printed product
• ISSN: 0361-5235; 1543-186X
• DOI: 10.1007/s11664-014-3524-4

We describe an optical three dimensional (3D) measurement method using white-light dispersive interferometry in the range of 5  μ m–150  μ m. A spectrometer was employed for real-time wavelength scanning and the distance information was obtained using a simple peak detection method in the spectral domain. Fast measurement time enabled us real-time distance measurement of the specimen. The piezoelectric actuator and capacitance distance sensor was employed for nanometer positioning and measuring distance reference value. This technique can be implemented as a distance measurement unit in white-light scanning interferometry by simply attaching a spectrometer to the conventional system. The results showed an accuracy of better than 60 nm for any position within 5  μ m–150  μ m. The proposed technique can be used as shape-measuring tool for 3D printed products. Measurement results using the proposed method are also presented. These experimental results show that pthe roposed method can be used as a measurement tool for 3D printed products.