The oxidation of metal-capped Co cluster films under ambient conditions

We report on the unexpected deterioration under ambient conditions of films of Co clusters capped with relatively thick (>100 nm) Cu (or Ti) layers deposited by either thermal evaporation or by radiofrequency sputtering. The magnetic character of the clusters, prepared by gas-phase condensation,...

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Bibliographic Details
Published inNanotechnology Vol. 20; no. 8; p. 085710
Main Authors De Toro, J A, Andrés, J P, González, J A, Muñiz, P, Riveiro, J M
Format Journal Article
LanguageEnglish
Published England IOP Publishing 25.02.2009
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Summary:We report on the unexpected deterioration under ambient conditions of films of Co clusters capped with relatively thick (>100 nm) Cu (or Ti) layers deposited by either thermal evaporation or by radiofrequency sputtering. The magnetic character of the clusters, prepared by gas-phase condensation, allows monitoring the oxidation of the samples through the decay of the saturation magnetization, which takes place on a timescale of days. By contrast, diluted (<10 at.%) cluster-assembled granular Co:Cu films, prepared by co-deposition of the Co clusters with a Cu vapour, are perfectly stable under ambient conditions. We tentatively explain the oxidation of the cluster films as stemming from their very high porosity.
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ISSN:0957-4484
1361-6528
DOI:10.1088/0957-4484/20/8/085710