External and internal reflection near field microscopy: experiments and results

Two configurations of a scanning near field optical microscope working in reflection are presented. Results exhibiting nanometric resolution are given and discussed.

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Bibliographic Details
Published inApplied optics (2004) Vol. 29; no. 26; p. 3734
Main Authors Courjon, D, Vigoureux, J M, Spajer, M, Sarayeddine, K, Leblanc, S
Format Journal Article
LanguageEnglish
Published United States 10.09.1990
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Summary:Two configurations of a scanning near field optical microscope working in reflection are presented. Results exhibiting nanometric resolution are given and discussed.
ISSN:1559-128X
2155-3165
DOI:10.1364/ao.29.003734