Dynamic Aperture of Near-Field Super Resolution Structures

Direct experimental observation of the near-field aperture formed in the super resolution near-field structure of glass/SiN(170 nm)/Sb(15 nm)/SiN(20 nm) has been achieved using a tapping-mode tuning-fork near-field scanning optical microscope. Both propagating and evanescent field intensities were f...

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Published inJapanese Journal of Applied Physics Vol. 39; no. 2S; pp. 982 - 983
Main Authors Tsai, Din Ping, Yang, Chi Wen, Lin, Wei Chih, Ho, Fu Han, Huang, Hung Ji, Ming Yish Chen, Ming Yish Chen, Tzu Feng Tseng, Tzu Feng Tseng, Chiu Hsiang Lee, Chiu Hsiang Lee, Chwei Jing Yeh, Chwei Jing Yeh
Format Journal Article
LanguageEnglish
Published 2000
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Summary:Direct experimental observation of the near-field aperture formed in the super resolution near-field structure of glass/SiN(170 nm)/Sb(15 nm)/SiN(20 nm) has been achieved using a tapping-mode tuning-fork near-field scanning optical microscope. Both propagating and evanescent field intensities were found at the focused spots of the surface of the super resolution structure. Images of the near-field intensity gradients at different excited laser powers (0.45–2.33 µW) demonstrated that the area of the static evanescent intensity could be stably controlled.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
ISSN:0021-4922
1347-4065
DOI:10.1143/JJAP.39.982