APA (7th ed.) Citation

Marques, I., Rodrigues, C., Tavares, A., Pinto, S., & Gomes, T. (2021). Lock-V: A heterogeneous fault tolerance architecture based on Arm and RISC-V. Microelectronics and reliability, 120, 1-8. https://doi.org/10.1016/j.microrel.2021.114120

Chicago Style (17th ed.) Citation

Marques, Ivo, Cristiano Rodrigues, Adriano Tavares, Sandro Pinto, and Tiago Gomes. "Lock-V: A Heterogeneous Fault Tolerance Architecture Based on Arm and RISC-V." Microelectronics and Reliability 120 (2021): 1-8. https://doi.org/10.1016/j.microrel.2021.114120.

MLA (9th ed.) Citation

Marques, Ivo, et al. "Lock-V: A Heterogeneous Fault Tolerance Architecture Based on Arm and RISC-V." Microelectronics and Reliability, vol. 120, 2021, pp. 1-8, https://doi.org/10.1016/j.microrel.2021.114120.