Substrate Integrated Waveguide Cavity Resonators for Complex Permittivity Characterization of Materials

• Published in: IEEE transactions on microwave theory and techniques Vol. 56; no. 10; pp. 2340 - 2347
• Main Authors: Saeed, K., Pollard, R.D., Hunter, I.C.
• Format: Journal Article
• Language: English
• Published: New York, NY IEEE 01.10.2008; Institute of Electrical and Electronics Engineers; The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
• Subjects: Applied sciences; Cavity perturbation methods; Cavity resonators; Circuit properties; Complex permittivity; Dielectric constant; Dielectric materials; Dielectric measurements; Dielectric substrates; Electric, optical and optoelectronic circuits; Electronic circuits; Electronics; Exact sciences and technology; Frequency measurement; Holes; Microwave circuits, microwave integrated circuits, microwave transmission lines, submillimeter wave circuits; microwave resonators; Microwaves; Oscillators, resonators, synthetizers; Permittivity measurement; permittivity measurements; Pharmaceuticals; Planar waveguides; Q factors; Q measurement; Resonance; Resonant frequencies; Waveguides; Waveguide resonator; microwave resonators; Permittivity measurement; High Q factor; Q factor; permittivity measurements; Resonant structure; Dielectric measurement; Perturbation; Cavity perturbation methods; Frequency shift; Perturbation method; Planar waveguide; Cavity; Resonance frequency; Cavity resonator; Microwave resonator; Complex permittivity; Permittivity; Cost lowering
• ISSN: 0018-9480; 1557-9670
• DOI: 10.1109/TMTT.2008.2003523

A novel planar substrate integrated waveguide cavity resonator technique for measurement of complex permittivity is described, which has applications for dielectric measurement systems in the pharmaceutical industry. The high- Q resonant structure is a modernization of well-known measurement cells where the dielectric constant is deduced by cavity perturbation from the shift in resonant frequency and the change in the Q factor. The method uses extremely small amounts of a broad range of materials for accurate characterization. The ease of fabrication, low cost, and potential for integration with many other components on the same substrate allows it to be used in a disposable manner.