Determining deposits on knit fabrics, yarns, and fibers, from sensor-related treatments

• Published in: Journal of the Textile Institute Vol. 115; no. 8; pp. 1229 - 1241
• Main Authors: Wilson, Sophie A., Laing, Raechel M., Tan, Eng, Wilson, Cheryl A., Arachchige, P. Samanali Garagoda, Gordon, Keith C., Fraser-Miller, Sara J.
• Format: Journal Article
• Language: English
• Published: Manchester Taylor & Francis 02.08.2024; Taylor & Francis Ltd
• Subjects: Chemical composition; Cotton; Deposition; Dipping; Electrical resistivity; Encapsulation; Fabrics; Fibers; Graphene; Image analysis; Infrared analysis; knit; Microscopy; Optical microscopy; Raman spectra; Raman spectroscopy; spectroscopy; Spectrum analysis; Surface properties; wool; Yarn; Yarns
• ISSN: 0040-5000; 1754-2340
• DOI: 10.1080/00405000.2023.2221427

Creation of a knit fabric-based, stable sensor using dipping and encapsulation processes is feasible, but where deposition occurs in the structure is not yet well understood. Using two graphene treatments and three encapsulants applied to single jersey (100% wool, 100% cotton), relative merits of a range of surface characterization tools (e.g., photographic - optical microscopy, scanning electron microscopy, image analysis (pixel intensity, fiber dimensions), change in lightness (L*, ΔL*, ΔE),) and chemical tools (e.g. vibrational spectroscopy - infrared and Raman) were applied to determine evidence of the treatments. Fabrics, yarns extracted from the treated fabrics and fibers from yarns were each examined. Structure of the fabric, yarns in the fabric, and fibers in the yarns remained clearly identifiable using microscopic methods, suggesting these physical features were largely unchanged. With respect to probable chemical composition, Raman analysis was found preferable to FTIR. HIGHLIGHTS Conferring electrical conductivity directly on knit fabric by simple dipping and stabilizing is feasible. Deposition sites of graphene-related treatments and encapsulants have been identified, with some observed differences dependent on structure, whether fabric, yarn, or fiber. Photographic images (optical, SEM), and FTIR and Raman spectra provide evidence, with Raman superior to FTIR.