Total Dose and Single Event Transients in Linear Voltage Regulators

Radiation effects on four common DC linear voltage regulators are investigated. Increasing total dose is shown to degrade converter regulation by degrading the loop gain and phase response. Regulator single event transient (SET) response is characterized, and a mitigation technique is proposed. Shun...

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Bibliographic Details
Published inIEEE transactions on nuclear science Vol. 54; no. 4; pp. 1327 - 1334
Main Authors Kelly, A.T., Adell, P.C., Witulski, A.F., Holman, W.T., Schrimpf, R.D., Pouget, V.
Format Journal Article
LanguageEnglish
Published New York IEEE 01.08.2007
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Institute of Electrical and Electronics Engineers
Subjects
Circuit topology
Control
Degradation
Driver circuits
Electronics
Engineering Sciences
Feedback circuits
Feedback loop
Frequency response
Gain
linear voltage regulator
Operational amplifiers
Radiation tolerance
Regulators
Resistors
Sampling methods
Shunts
single event transient (SET)
Topology
total ionizing dose
Voltage control
Voltage regulators
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Summary:Radiation effects on four common DC linear voltage regulators are investigated. Increasing total dose is shown to degrade converter regulation by degrading the loop gain and phase response. Regulator single event transient (SET) response is characterized, and a mitigation technique is proposed. Shunt regulator topologies are found to be superior to series regulator topologies in terms of radiation tolerance.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
ISSN:0018-9499
1558-1578
DOI:10.1109/TNS.2007.903243