Non-perturbing THz generation at the Tsinghua University Accelerator Laboratory 31 MeV electron beamline
In recent experiments at Tsinghua University Accelerator Laboratory, the 31 MeV electron beam, which has been compressed to subpicosecond pulse durations, has been used to generate high peak power, narrow band Terahertz (THz) radiation by transit through different slow wave structures, specifically...
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Published in | Review of scientific instruments Vol. 89; no. 9; p. 093301 |
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Main Authors | , , , , , , , , , , |
Format | Journal Article |
Language | English |
Published |
United States
01.09.2018
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Online Access | Get more information |
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Summary: | In recent experiments at Tsinghua University Accelerator Laboratory, the 31 MeV electron beam, which has been compressed to subpicosecond pulse durations, has been used to generate high peak power, narrow band Terahertz (THz) radiation by transit through different slow wave structures, specifically quartz capillaries metallized on the outside. Despite the high peak powers that have been produced, the THz pulse energy is negligible compared to the energy of the electron beam. Therefore, the THz generation process can be complementary to other beamline applications like plasma wakefield acceleration studies and Compton x-ray free electron lasers. This approach can be used at x-ray free electron laser beamlines, where THz radiation can be generated without disturbing the x-ray generation process. In the experiment reported here, a high peak current electron beam generated strong narrow band (∼1% bandwidth) THz signals in the form of a mixture of TM
and TM
modes. Each slow wave structure is completed with a mode converter at the end of the structure that allows for efficient (>90%) power extraction into free space. In the experiment, both modes in these two dielectric-loaded waveguides TM
(0.3 THz/0.5 THz) and TM
(0.9 THz/1.3 THz) were explicitly measured with an interferometer. The THz pulse energy was measured with a calibrated Golay cell at a few
J. |
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ISSN: | 1089-7623 |
DOI: | 10.1063/1.5042006 |