Tip-enhanced Raman spectroscopy of graphite irradiated by focused ion beam

Tip-enhanced Raman spectroscopy with a spatial resolution of 25 nm is conducted on a sample of graphite that has been exposed to a 50 keV focused Ga ion beam with a diameter of 20 nm. The G mode located at 1579 cm(-1) does not exhibit a measurable tip enhancement, while the D mode at 1364 cm(-1) is...

Full description

Saved in:
Bibliographic Details
Published inOptics letters Vol. 34; no. 15; p. 2246
Main Authors Chan, Tsu-Shin, Dvoynenko, Mykhaylo M, Liu, Chih-Yi, Wang, Juen-Kai, Wang, Yuh-Lin
Format Journal Article
LanguageEnglish
Published United States 01.08.2009
Online AccessGet more information

Cover

More Information
Summary:Tip-enhanced Raman spectroscopy with a spatial resolution of 25 nm is conducted on a sample of graphite that has been exposed to a 50 keV focused Ga ion beam with a diameter of 20 nm. The G mode located at 1579 cm(-1) does not exhibit a measurable tip enhancement, while the D mode at 1364 cm(-1) is significantly enhanced. A method is proposed to calculate the enhancement factor of anisotropic materials due to the electromagnetic field using the measured signal enhancement induced by the tip.
ISSN:0146-9592
DOI:10.1364/ol.34.002246