Spatial and Temporal Characterization of Programming Charge in SONOS Memory Cell: Effects of Localized Electron Trapping

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Bibliographic Details
Published inJapanese Journal of Applied Physics Vol. 43; no. No. 12B; pp. L1581 - L1583
Main Authors Kim, Bomsoo, Baek, Chang-Ki, Kwon, Wookhyun, Lee, Jawoong, Jeong, Yoon-Ha, Kim, Dae M.
Format Journal Article
LanguageEnglish
Published 15.12.2004
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ISSN:0021-4922
DOI:10.1143/JJAP.43.L1581