In situ observation of the orientation relationship at the interface plane between substrate and nucleus using X-ray scattering techniques

Orientation relationship at the interface plane between substrate and nucleus is an important factor influencing the potency of the substrate. We explored synchrotron X-ray scattering techniques to observe in situ the nucleation and early stage solidification behaviour when liquid is in contact with...

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Bibliographic Details
Published inScripta materialia Vol. 77; pp. 60 - 63
Main Authors Brown, A.J., Dong, H.B., Howes, P.B., Nicklin, C.L.
Format Journal Article
LanguageEnglish
Published Elsevier Ltd 15.04.2014
Subjects
Aluminium
Heterogeneous nucleation
Nucleation undercooling
Orientation relationship
X-ray diffraction
Nucleation undercooling
Heterogeneous nucleation
X-ray diffraction
Orientation relationship
Aluminium
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Summary:Orientation relationship at the interface plane between substrate and nucleus is an important factor influencing the potency of the substrate. We explored synchrotron X-ray scattering techniques to observe in situ the nucleation and early stage solidification behaviour when liquid is in contact with a specific crystal plane of a solid substrate. The diffraction data reveal the orientation relationship between the substrate and the nucleus, in particular the interface plane, and its influence on the required undercooling for nucleation.
ISSN:1359-6462
1872-8456
DOI:10.1016/j.scriptamat.2014.01.023