WSXM: a software for scanning probe microscopy and a tool for nanotechnology

In this work we briefly describe the most relevant features of WSXM, a freeware scanning probe microscopy software based on MS-Windows. The article is structured in three different sections: The introduction is a perspective on the importance of software on scanning probe microscopy. The second sect...

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Bibliographic Details
Published inReview of scientific instruments Vol. 78; no. 1; p. 013705
Main Authors Horcas, I, Fernández, R, Gómez-Rodríguez, J M, Colchero, J, Gómez-Herrero, J, Baro, A M
Format Journal Article
LanguageEnglish
Published United States 01.01.2007
Subjects
Image Enhancement
Microscopy, Atomic Force - methods
Nanotechnology - methods
Software
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Summary:In this work we briefly describe the most relevant features of WSXM, a freeware scanning probe microscopy software based on MS-Windows. The article is structured in three different sections: The introduction is a perspective on the importance of software on scanning probe microscopy. The second section is devoted to describe the general structure of the application; in this section the capabilities of WSXM to read third party files are stressed. Finally, a detailed discussion of some relevant procedures of the software is carried out.
ISSN:0034-6748
DOI:10.1063/1.2432410