Surface-treated self-standing curved crystals as high-efficiency elements for X- and γ-ray optics: theory and experiment

• Published in: Journal of applied crystallography Vol. 48; no. 3; pp. 666 - 671
• Main Authors: Bonnini, Elisa, Buffagni, Elisa, Zappettini, Andrea, Doyle, Stephen, Ferrari, Claudio
• Format: Journal Article
• Language: English
• Published: 5 Abbey Square, Chester, Cheshire CH1 2HU, England International Union of Crystallography 01.06.2015
• Subjects: crystal stacks; curved crystals; integrated reflectivity; X-ray focusing lenses; curved crystals; integrated reflectivity; X-ray focusing lenses; crystal stacks
• ISSN: 1600-5767; 0021-8898; 1600-5767
• DOI: 10.1107/S1600576715006809

The efficiency of a Laue lens for X‐ and γ‐ray focusing in the energy range 60–600 keV is closely linked to the diffraction efficiency of the single crystals composing the lens. A powerful focusing system is crucial for applications like medical imaging and X‐ray astronomy where wide beams must be focused. Mosaic crystals with a high density, such as Cu or Au, and bent crystals with curved diffracting planes (CDPs) are considered for the realization of a focusing system for γ‐rays, owing to their high diffraction efficiency in a predetermined angular range. In this work, a comparison of the efficiency of CDP crystals and Cu and Au mosaic crystals was performed on the basis of the theory of X‐ray diffraction. Si, GaAs and Ge CDP crystals with optimized thicknesses and moderate radii of curvature of several tens of metres demonstrate comparable or superior performance with respect to the higher atomic number mosaic crystals generally used. In order to increase the efficiency of the lens further, a stack of several CDP crystals is proposed as an optical element. CDP crystals were obtained by a surface‐damage method, and a stack of two surface‐damaged bent Si crystals was prepared and tested. Rocking curves of the stack were performed with synchrotron radiation at 19 keV to check the lattice alignment: they exhibited only one diffraction peak.