Formation of Hydroxyapatite Thin Films on Surface-Modified Polytetrafluoroethylene Substrates

• Published in: Japanese Journal of Applied Physics Vol. 37; no. 10A; p. L1169
• Main Authors: Shigeki Hontsu, Shigeki Hontsu, Masaya Nakamori, Masaya Nakamori, Nobuhiro Kato, Nobuhiro Kato, Hitoshi Tabata, Hitoshi Tabata, Junya Ishii, Junya Ishii, Toshirou Matsumoto, Toshirou Matsumoto, Tomoji Kawai, Tomoji Kawai
• Format: Journal Article
• Language: English
• Published: 01.10.1998
• ISSN: 0021-4922; 1347-4065
• DOI: 10.1143/JJAP.37.L1169

An ArF excimer laser deposition technique is used to fabricate hydroxyapatite [Ca 10 (PO 4 ) 6 (OH) 2 ]-(HAp) thin films on surface-modified polytetrafluoroethylene (PTFE) substrates. The surface of PTFE is modified by a sodium-naphthalene complex in a glycol ether solvent. X-ray diffraction (XRD) studies indicate that as-deposited films prepared at substrate temperatures below the glass transition temperature of PTFE (327°C) are in an amorphous state. The crystallization of as-deposited films needed annealing for 10 h at 310°C. The structure, surface morphology and bond strength of HAp films were evaluated using XRD, the atomic force microscopy (AFM) and the Instron testing machine. The tensile bond strength of HAp films on surface-modified PTFE was 6.0 MPa, which is one order of magnitude larger than that of films on non-surface-modified PTFE, demonstrating its potential for practical applications.