Experimental Study on Isolation Characteristics Between Adjacent Microstrip Lines Employing Periodically Perforated Ground Metal for Application to Highly Integrated GaAs MMICs

Using a periodically perforated ground metal (PPGM) on GaAs monolithic microwave integrated circuit (MMIC), a microstrip line structure with a high isolation characteristic between lines was developed. The high isolation characteristic was originated from a resonance between adjacent microstrip line...

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Published inIEEE microwave and wireless components letters Vol. 17; no. 10; pp. 703 - 705
Main Authors YUN, Young, JUNG, Ji-Won, KIM, Ki-Man, KIM, Hae-Cheon, CHANG, Woo-Jin, JI, Hong-Gu, AHN, Ho-Kyun
Format Journal Article
LanguageEnglish
Published New York, NY IEEE 01.10.2007
Institute of Electrical and Electronics Engineers
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Summary:Using a periodically perforated ground metal (PPGM) on GaAs monolithic microwave integrated circuit (MMIC), a microstrip line structure with a high isolation characteristic between lines was developed. The high isolation characteristic was originated from a resonance between adjacent microstrip lines employing PPGM. According to experimental results, a much better isolation characteristic was observed from the adjacent microstrip lines employing PPGM compared with conventional microstrip lines, and the frequency range for high isolation was easily controlled by changing the PPGM structure. Above results indicate that microstrip lines employing PPGM are very useful for application to compact signal/bias lines of highly integrated MMIC requiring a high isolation characteristics between lines.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
ISSN:1531-1309
1558-1764
DOI:10.1109/LMWC.2007.905597