Synthesis and Characterization of Ni-Doped ZnO Thin Films Prepared by Sol–Gel Spin-Coating Method

Ni-doped ZnO (ZnO:Ni) thin films were deposited onto glass substrate by sol–gel spin-coating method using zinc acetate dehydrate and nickel(II) chloride hexahydrate. The structural, morphological, and optical properties of ZnO:Ni thin films under various doping level of nickel were investigated usin...

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Bibliographic Details
Published inSemiconductors (Woodbury, N.Y.) Vol. 55; no. 5; pp. 482 - 490
Main Authors Ayachi, M., Ayad, F., Djelloul, A., Benharrat, L., Anas, S.
Format Journal Article
LanguageEnglish
Published Moscow Pleiades Publishing 01.05.2021
Springer
Springer Nature B.V
Subjects
Analysis
Atomic force microscopes
Atomic force microscopy
Coatings
Dehydration
Dielectric films
Diffraction
Fourier transforms
Glass substrates
Grain size
Magnetic Materials
Magnetism
Methods
Microscopes
Morphology
Nickel
Optical properties
Physics
Physics and Astronomy
Preferred orientation
Scanning electron microscopy
Sol-gel processes
Spin coating
Thin films
Ultraviolet spectra
Wurtzite
X-ray diffraction
X-rays
Zinc acetate
Zinc coatings
Zinc oxide
sol–gel spin-coating
morphological
structural
ZnO:Ni
optical
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Summary:Ni-doped ZnO (ZnO:Ni) thin films were deposited onto glass substrate by sol–gel spin-coating method using zinc acetate dehydrate and nickel(II) chloride hexahydrate. The structural, morphological, and optical properties of ZnO:Ni thin films under various doping level of nickel were investigated using X-ray diffraction (XRD), ultraviolet–visible transmission spectra (UV–Vis), atomic force microscope (AFM), scanning electron microscopy (SEM) and Fourier transform infrared (FTIR) measurements. XRD patterns indicated that the deposited films had a crystalline hexagonal wurtzite structure with preferred orientation in the (0 0 2) plane when the grain size varied between 36.5 and 44.5 nm. All films were found to exhibit a good transparency in the visible range with the maximum transmittance of 95% and the optical band gap energies were found between 3.15 and 3.22 eV. The SEM morphology shows the non-doped and Ni-doped ZnO thin films are continuous, dense, and distributed over the entire area with good uniformity. All parameters procured for Ni:ZnO composite thin films propel the possibility of using composite thin films for transparent conducting electrode applications.
ISSN:1063-7826
1090-6479
DOI:10.1134/S1063782621050043