Effects of magnetic field on the manganite-based trilayer junction

A heterojunction has been fabricated by growing a $\chem{La_{0.29}Pr_{0.38}Ca_{0.33}Mn}$-$\chem{O_3}$ (LPCM) film on an $\chem{AlN}$ buffer layer above the 0.5$\un{wt}$% $\chem{Nb}$-doped $\chem{SrTiO_3}$ substrate, and its behavior under magnetic field is studied. The magnetic field greatly affects...

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Bibliographic Details
Published inEurophysics letters Vol. 66; no. 6; pp. 868 - 873
Main Authors Sun, J. R, Xiong, C. M, Chen, Y. F, Shen, B. G, Kang, L
Format Journal Article
LanguageEnglish
Published IOP Publishing 01.06.2004
EDP Sciences
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Summary:A heterojunction has been fabricated by growing a $\chem{La_{0.29}Pr_{0.38}Ca_{0.33}Mn}$-$\chem{O_3}$ (LPCM) film on an $\chem{AlN}$ buffer layer above the 0.5$\un{wt}$% $\chem{Nb}$-doped $\chem{SrTiO_3}$ substrate, and its behavior under magnetic field is studied. The magnetic field greatly affects the rectifying property and the resistance of the junction, causing an extremely large magnetoresistance (MR). The MR is asymmetric with respect to the direction of the current, and can be either positive or negative, depending on temperature and bias current. A change of the band structure of LPCM under external field may be responsible for these observations.
Bibliography:ark:/67375/80W-WH53XTMQ-P
istex:DED392251F970359ACA61B92A727099D3041043B
publisher-ID:epl8195
ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
ISSN:0295-5075
1286-4854
DOI:10.1209/epl/i2004-10032-x