Analysis of amphetamines and fentanyls by atmospheric pressure desorption/ionization on silicon mass spectrometry and matrix-assisted laser desorption/ionization mass spectrometry and its application to forensic analysis of drug seizures

The suitability of atmospheric pressure desorption/ionization on silicon mass spectrometry (AP‐DIOS‐MS) and matrix‐assisted laser desorption ionization mass spectrometry (AP‐MALDI‐MS) for the identification of amphetamines and fentanyls in forensic samples was studied. With both ionization technique...

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Published inJournal of mass spectrometry. Vol. 40; no. 4; pp. 539 - 545
Main Authors Pihlainen, Katja, Grigoras, Kestutis, Franssila, Sami, Ketola, Raimo, Kotiaho, Tapio, Kostiainen, Risto
Format Journal Article
LanguageEnglish
Published Chichester, UK John Wiley & Sons, Ltd 01.04.2005
Wiley
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Summary:The suitability of atmospheric pressure desorption/ionization on silicon mass spectrometry (AP‐DIOS‐MS) and matrix‐assisted laser desorption ionization mass spectrometry (AP‐MALDI‐MS) for the identification of amphetamines and fentanyls in forensic samples was studied. With both ionization techniques, the mass spectra recorded showed abundant protonated molecules, and the background did not disturb the analysis. The use of tandem mass spectrometry (MS/MS) allowed unambiguous identification of the amphetamines and fentanyls. AP‐DIOS‐MS/MS and AP‐MALDI‐MS/MS were also successfully applied to the identification of authentic compounds from drug seizures. Common diluents and tablet materials did not disturb the analysis and compounds were unequivocally identified. The limits of detection (LODs) for amphetamines and fentanyls with AP‐DIOS‐MS/MS were 1–3 pmol, indicating excellent sensitivity of the method. The LODs with AP‐MALDI‐MS/MS were about 5–10 times higher. Copyright © 2005 John Wiley & Sons, Ltd.
Bibliography:ark:/67375/WNG-Z3B5S8MR-S
National Technology Agency of Finland.
Jenny and Antti Wihuri Foundation.
istex:F4C14C22B2C14DEF8DED27352255F9FA23354E2E
ArticleID:JMS831
ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 23
ISSN:1076-5174
1096-9888
DOI:10.1002/jms.831