Crystal Direction of CdS Thin Film Produced by Laser Ablation
The crystal direction of CdS thin films produced by the laser ablation was measured using X-ray diffractometer (XRD). The results reveal that the direction of the CdS crystal depends considerably on the substrate temperature and laser energy density. The c -axis of the CdS crystal changed from perpe...
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| Published in | Japanese Journal of Applied Physics Vol. 37; no. 7R; p. 4149 |
|---|---|
| Main Authors | , , , , |
| Format | Journal Article |
| Language | English |
| Published |
01.07.1998
|
| Online Access | Get full text |
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| Summary: | The crystal direction of CdS thin films produced by the laser ablation was
measured using X-ray diffractometer (XRD). The results reveal that the direction
of the CdS crystal depends considerably on the substrate temperature and laser
energy density. The
c
-axis of the CdS crystal changed from perpendicular to
parallel with the surface as the laser energy density increased. The parallality
of
c
-axis may be due to the clusters included in the laser plume. On the other
hand, the
c
-axis changed from parallel to perpendicular as the substrate
temperature increased. This phenomenon is considered to be that the clusters
on the substrate melting and re-crystallizing at the film surface due to the
high temperature prevailing during laser ablation. |
|---|---|
| ISSN: | 0021-4922 1347-4065 |
| DOI: | 10.1143/JJAP.37.4149 |