Sample-and-Hold Imaging for Fast Scanning in Atomic Force Microscopy

We have proposed to use a sample-and-hold circuit for direct monitoring of cantilever deflection signals as a novel method for fast imaging in an intermittent contact mode atomic force microscopy (AFM). This method enables us to construct a quasi-topographic image from tip heights at moments when th...

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Bibliographic Details
Published inJapanese Journal of Applied Physics Vol. 43; no. 4B; p. L582
Main Authors Takahashi, Takuji, Ono, Shiano
Format Journal Article
LanguageEnglish
Published 15.04.2004
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Summary:We have proposed to use a sample-and-hold circuit for direct monitoring of cantilever deflection signals as a novel method for fast imaging in an intermittent contact mode atomic force microscopy (AFM). This method enables us to construct a quasi-topographic image from tip heights at moments when the tip taps on a sample surface. As a result, we obtained the tip height image well corresponding to the sample topography at a scanning rate above 30 Hz/line without any other customization on both a cantilever and a piezo scanner in a commercial AFM system.
ISSN:0021-4922
1347-4065
DOI:10.1143/JJAP.43.L582