Wavelet phase evaluation of white light interferograms

The surface profile of a rough object is obtained by white light interferometry. The real and noisy simulated correlograms are analysed by using sliding average, continuous wavelet transform and a new algorithm that is called the continuous wavelet transform phase method. Measurement repeatability i...

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Bibliographic Details
Published inMeasurement science & technology Vol. 16; no. 9; pp. 1878 - 1882
Main Authors Saraç, Zehra, Dursun, Ali, Yerdelen, Sündüs, Ecevit, F Necati
Format Journal Article
LanguageEnglish
Published IOP Publishing 01.09.2005
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Summary:The surface profile of a rough object is obtained by white light interferometry. The real and noisy simulated correlograms are analysed by using sliding average, continuous wavelet transform and a new algorithm that is called the continuous wavelet transform phase method. Measurement repeatability is calculated for each algorithm and it has been shown that the continuous wavelet transform phase method gives a smaller peak to valley value and standard deviation than other methods. Hence, this algorithm can be used to obtain a good repeatability or standard deviation in white light interferometry.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
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ISSN:0957-0233
1361-6501
DOI:10.1088/0957-0233/16/9/021