HSPICE macromodel of PCRAM for binary and multilevel storage

A general macromodel of the phase change random access memory (PCRAM) elements for use in HSPICE-based computer simulator is proposed in this paper by introducing physical models of PCRAM elements. It can simulate the dc and transient behavior of PCRAM element. In this paper, the model was integrate...

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Published inIEEE transactions on electron devices Vol. 53; no. 1; pp. 56 - 62
Main Authors Wei, X.Q., Shi, L.P., Walia, R., Chong, T.C., Zhao, R., Miao, X.S., Quek, B.S.
Format Journal Article
LanguageEnglish
Published New York, NY IEEE 01.01.2006
Institute of Electrical and Electronics Engineers
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
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Summary:A general macromodel of the phase change random access memory (PCRAM) elements for use in HSPICE-based computer simulator is proposed in this paper by introducing physical models of PCRAM elements. It can simulate the dc and transient behavior of PCRAM element. In this paper, the model was integrated with the standard R/W circuit and successfully simulated the R-I curve and dependence between amplitude and width of programming pulses. A comparison between experimental and simulation results were also given. Furthermore, by including the partial crystallization states, the macromodel was developed for simulating the multilevel storage.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
ISSN:0018-9383
1557-9646
DOI:10.1109/TED.2005.860645