High-speed graded-channel AlGaN/GaN HEMTs with power added efficiency >70% at 30 GHz

The authors report on highly scaled 60 nm gate length graded-channel AlGaN/GaN high electron mobility transistors (HEMTs) with a record power added efficiency (PAE) of 75% at 2.1 W/mm power density at Vdd = 10 V and the PAE of 65% at 3.0 W/mm power density at 30 GHz at Vdd = 14 V. Under two-tone pow...

Full description

Saved in:
Bibliographic Details
Published inElectronics letters Vol. 56; no. 13; pp. 678 - 680
Main Authors Moon, J.S, Grabar, R, Wong, J, Antcliffe, M, Chen, P, Arkun, E, Khalaf, I, Corrion, A, Chappell, J, Venkatesan, N, Fay, P
Format Journal Article
LanguageEnglish
Published The Institution of Engineering and Technology 25.06.2020
Subjects
Online AccessGet full text

Cover

Loading…
More Information
Summary:The authors report on highly scaled 60 nm gate length graded-channel AlGaN/GaN high electron mobility transistors (HEMTs) with a record power added efficiency (PAE) of 75% at 2.1 W/mm power density at Vdd = 10 V and the PAE of 65% at 3.0 W/mm power density at 30 GHz at Vdd = 14 V. Under two-tone power measurement, the graded-channel AlGaN/GaN HEMTs demonstrated similar power performance with peak PAE >70% at 30 GHz. This novel channel design shows great promise for high-efficiency millimetre-wave (mmW) power amplifiers up to 3 W/mm RF power density operation.
ISSN:0013-5194
1350-911X
1350-911X
DOI:10.1049/el.2020.0281