Stochastic fault tree analysis with self-loop basic events

This paper presents an analytical approach for performing fault tree analysis (FTA) with stochastic self-loop events. The proposed approach uses the flow-graph concept, and moment generating function (MGF) to develop a new stochastic FTA model for computing the probability, mean time to occurrence,...

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Bibliographic Details
Published inIEEE transactions on reliability Vol. 54; no. 1; pp. 173 - 180
Main Authors Jenab, K., Dhillon, B.S.
Format Journal Article
LanguageEnglish
Published New York IEEE 01.03.2005
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subjects
Application specific integrated circuits
Computing time
DH-HEMTs
Distribution functions
Event detection
Fault detection
Fault tree
Fault tree analysis
Fault trees
Field programmable gate arrays
flow-graph
Mathematical analysis
Mathematical models
Performance analysis
reliability model
Standard deviation
stochastic failure analysis
Stochastic processes
Stochasticity
US Department of Transportation
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Summary:This paper presents an analytical approach for performing fault tree analysis (FTA) with stochastic self-loop events. The proposed approach uses the flow-graph concept, and moment generating function (MGF) to develop a new stochastic FTA model for computing the probability, mean time to occurrence, and standard deviation time to occurrence of the top event. The application of the method is demonstrated by solving one example.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
ISSN:0018-9529
1558-1721
DOI:10.1109/TR.2004.842087