Sensitivity Analysis of Cirrus Cloud Properties from High-Resolution Infrared Spectra. Part I Methodology and Synthetic Cirrus
A set of simulated high-resolution infrared (IR) emission spectra of synthetic cirrus clouds is used to perform a sensitivity analysis of top-of-atmosphere (TOA) radiance to cloud parameters. Principal component analysis (PCA) is applied to assess the variability of radiance across the spectrum with...
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Published in | Journal of climate Vol. 17; no. 24; pp. 4856 - 4870 |
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Main Authors | , , , , |
Format | Journal Article |
Language | English |
Published |
Boston, MA
American Meteorological Society
15.12.2004
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Subjects | |
Online Access | Get full text |
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Summary: | A set of simulated high-resolution infrared (IR) emission spectra of synthetic cirrus clouds is used to perform a sensitivity analysis of top-of-atmosphere (TOA) radiance to cloud parameters. Principal component analysis (PCA) is applied to assess the variability of radiance across the spectrum with respect to microphysical and bulk cloud quantities. These quantities include particle shape, effective radius (r
eff), ice water path (IWP), cloud heightZ
cldand thickness ΔZ
cld, and vertical profiles of temperatureT(z) and water vapor mixing ratiow(z). It is shown that IWP variations in simulated cloud cover dominate TOA radiance variability. Cloud height and thickness, as well asT(z) variations, also contribute to considerable TOA radiance variability.
The empirical orthogonal functions (EOFs) of radiance variability show both similarities and differences in spectral shape and magnitude of variability when one physical quantity or another is being modified. In certain cases, it is possible to identify the EOF that represents variability with respect to one or more physical quantities. In other instances, similar EOFs result from different sets of physical quantities, emphasizing the need for multiple, independent data sources to retrieve cloud parameters. When analyzing a set of simulated spectra that include joint variations of IWP,r
eff, andw(z) across a realistic range of values, the first two EOFs capture approximately 92%–97% and 2%–6% of the total variance, respectively; they reflect the combined effect of IWP andr
eff. The third EOF accounts for only 1%–2% of the variance and resembles the EOF from analysis of spectra where onlyw(z) changes. Sensitivity with respect to particle size increases significantly forr
effseveral tens of microns or less. For small-particler
eff, the sensitivity with respect to the joint variation of IWP,r
eff, andw(z) is well approximated by the sum of the sensitivities with respect to variations in each of three quantities separately. |
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Bibliography: | ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23 |
ISSN: | 0894-8755 1520-0442 |
DOI: | 10.1175/JCLI-3220.1 |