Sizes of Nanostructured Elements in Granular Conductor–Dielectric Composite Films Determined by Calculation and Atomic Force Microscopy

Granular composite films based on BaB 6 –LaB 6 , Sn 0.9 Sb 0.1 O 2 , and alumina borosilicate glass produced by screen-printing followed by heat treatment are studied. To find the thicknesses of nanosized dielectric layers between the conducting particles, predetermining the conductivity mechanism a...

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Bibliographic Details
Published inPowder metallurgy and metal ceramics Vol. 54; no. 1-2; pp. 23 - 30
Main Authors Rud, B. M., Shelud’ko, V. E.
Format Journal Article
LanguageEnglish
Published New York Springer US 12.06.2015
Subjects
Ceramics
Characterization and Evaluation of Materials
Chemistry and Materials Science
Composites
Glass
Materials Science
Metallic Materials
Nanostructured Materials
Natural Materials
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Summary:Granular composite films based on BaB 6 –LaB 6 , Sn 0.9 Sb 0.1 O 2 , and alumina borosilicate glass produced by screen-printing followed by heat treatment are studied. To find the thicknesses of nanosized dielectric layers between the conducting particles, predetermining the conductivity mechanism and film properties, a novel calculation method is used. To evaluate the reliability of the results, film structures are studied by atomic force microscopy. The calculated data are in good agreement with the experiment. The method may be applied in examining the structure and properties of new conductor–dielectric composites.
ISSN:1068-1302
1573-9066
DOI:10.1007/s11106-015-9675-x