Mathematical Approaches in Functional Safety Assessment for E/E/PE Safety-Related Software

Safety integrity level (SIL)-based functional safety assessment is widely required in designing safety functions and checking their validity of electrical/electronic/programmable electronic (E/E/PE) safety-related systems after being issued IEC 61508 in 2010. For the hardware of E/E/PE safety-relate...

Full description

Saved in:
Bibliographic Details
Published inInternational journal of reliability, quality, and safety engineering Vol. 29; no. 1
Main Authors Inoue, Shinji, Fujiwara, Takaji, Yamada, Shigeru
Format Journal Article
LanguageEnglish
Published Singapore World Scientific Publishing Company 01.02.2022
World Scientific Publishing Co. Pte., Ltd
Subjects
Computer program integrity
Failure
Functionals
Mathematical analysis
Reliability analysis
Safety
Software reliability
IEC 61508
Functional safety
software reliability model
E/E/PE safety-related systems
target failure measures
Online AccessGet full text

Cover

More Information
Summary:Safety integrity level (SIL)-based functional safety assessment is widely required in designing safety functions and checking their validity of electrical/electronic/programmable electronic (E/E/PE) safety-related systems after being issued IEC 61508 in 2010. For the hardware of E/E/PE safety-related systems, quantitative functional safety assessment based on target failure measures is needed for deciding or allocating the level of SIL. On the other hand, IEC 61508 does not provide any quantitative safety assessment method for allocating SIL for the software of E/E/PE safety-related systems because the software failure is treated as a systematic failure in IEC 61508. We discuss the needfulness of quantitative safety assessment for software of E/E/PE safety-related systems and propose mathematical fundamentals for conducting quantitative SIL-based safety assessment for the software of E/E/PE safety-related systems by applying the notion of software reliability modeling and assessment technologies. We show numerical examples for explaining how to use our approaches.
ISSN:0218-5393
1793-6446
DOI:10.1142/S0218539321500431