Local field and potential barrier in tunneling processes

Ionisation rate-constants in conditions of imaging processes in field ion microscopy are calculated by considering a local electric field that varies along the potential barrier. The results are then compared with previous calculations where the field along the barrier is taken as constant.

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Bibliographic Details
Published inApplied surface science Vol. 94; pp. 68 - 72
Main Authors Mollicone, M.M., Dacal, L.C.O., de Castilho, C.M.C.
Format Journal Article Conference Proceeding
LanguageEnglish
Published Amsterdam Elsevier B.V 01.03.1996
Elsevier Science
Subjects
Electron, positron and ion microscopes, electron diffractometers and related techniques
Exact sciences and technology
Instruments, apparatus, components and techniques common to several branches of physics and astronomy
Physics
Theoretical study
Field emission
Ion microscopy
Tunnel effect
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Summary:Ionisation rate-constants in conditions of imaging processes in field ion microscopy are calculated by considering a local electric field that varies along the potential barrier. The results are then compared with previous calculations where the field along the barrier is taken as constant.
ISSN:0169-4332
1873-5584
DOI:10.1016/0169-4332(95)00353-3