Local field and potential barrier in tunneling processes
Ionisation rate-constants in conditions of imaging processes in field ion microscopy are calculated by considering a local electric field that varies along the potential barrier. The results are then compared with previous calculations where the field along the barrier is taken as constant.
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Published in | Applied surface science Vol. 94; pp. 68 - 72 |
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Main Authors | , , |
Format | Journal Article Conference Proceeding |
Language | English |
Published |
Amsterdam
Elsevier B.V
01.03.1996
Elsevier Science |
Subjects | |
Online Access | Get full text |
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Summary: | Ionisation rate-constants in conditions of imaging processes in field ion microscopy are calculated by considering a local electric field that varies along the potential barrier. The results are then compared with previous calculations where the field along the barrier is taken as constant. |
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ISSN: | 0169-4332 1873-5584 |
DOI: | 10.1016/0169-4332(95)00353-3 |