Breakdown of the iron passive layer by use of the scanning electrochemical microscope

The scanning electrochemical microscope (SECM) is used to generate localized corrosion at passivating iron surfaces by using the tip to generate Cl exp - ions. Use of the SECM allows the rapid establishment of a locally aggressive chemical environment at a preselected site on the iron surface. The s...

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Bibliographic Details
Published inJournal of the Electrochemical Society Vol. 144; no. 8; pp. 2657 - 2665
Main Authors STILL, J. W, WIPF, D. O
Format Journal Article
LanguageEnglish
Published Pennington, NJ Electrochemical Society 01.08.1997
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Summary:The scanning electrochemical microscope (SECM) is used to generate localized corrosion at passivating iron surfaces by using the tip to generate Cl exp - ions. Use of the SECM allows the rapid establishment of a locally aggressive chemical environment at a preselected site on the iron surface. The susceptibility for passive layer breakdown and corrosion initiation was examined as a function of the time between the start of the passive layer growth and the formation of Cl exp - ions. The breakdown of the passive layer was found to depend strongly on the passivation potential and the site of Cl exp - formation on the iron surface. In addition to generating Cl exp - ions, the SECM tip was simultaneously used to detect large iron ion concentration fluctuations as corrosion began. Current fluctuations at the tip were observed and ascribed to precursors to the passive layer breakdown.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
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content type line 23
ISSN:0013-4651
1945-7111
DOI:10.1149/1.1837879