Statistical procedure for comparison of potential difference between single-component sample surface

Kelvin probe force microscopy (KPFM) is a valuable technique for visualizing local surface potential with high spatial resolution, although it is incapable of providing the absolute value of the surface potential owing to the unknown condition of the tip, which serves as a potential reference. Owing...

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Bibliographic Details
Published inApplied physics express Vol. 12; no. 7; pp. 75011 - 75014
Main Authors Kajimoto, Kentaro, Araki, Kento, Misaka, Tomoki, Sakamoto, Leo, Otsuka, Yoichi, Ohoyama, Hiroshi, Matsumoto, Takuya
Format Journal Article
LanguageEnglish
Published IOP Publishing 01.07.2019
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Summary:Kelvin probe force microscopy (KPFM) is a valuable technique for visualizing local surface potential with high spatial resolution, although it is incapable of providing the absolute value of the surface potential owing to the unknown condition of the tip, which serves as a potential reference. Owing to these uncontrollable variations in the tip properties, KPFM is of limited utility for comparing the surface potential between different single-component sample surfaces. This paper describes a statistical method for analyzing the variation of the contact potential difference during KPFM measurements.
Bibliography:APEX-102057.R1
ISSN:1882-0778
1882-0786
DOI:10.7567/1882-0786/ab26d2