Same-Day Bilateral Decubitus CT Myelography for Detecting CSF-Venous Fistulas in Spontaneous Intracranial Hypotension
Lateral decubitus CT myelography is a sensitive technique for detecting CSF-venous fistulas in patients with spontaneous intracranial hypotension. It might be necessary to perform bilateral studies to locate a fistula. We report on the feasibility of obtaining diagnostic-quality bilateral decubitus...
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Published in | American journal of neuroradiology : AJNR Vol. 43; no. 4; pp. 645 - 648 |
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Main Authors | , |
Format | Journal Article |
Language | English |
Published |
United States
American Society of Neuroradiology
01.04.2022
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Subjects | |
Online Access | Get full text |
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Summary: | Lateral decubitus CT myelography is a sensitive technique for detecting CSF-venous fistulas in patients with spontaneous intracranial hypotension. It might be necessary to perform bilateral studies to locate a fistula. We report on the feasibility of obtaining diagnostic-quality bilateral decubitus CT myelography in a single session, avoiding the need to schedule separate examinations for the left and right sides on different days. |
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Bibliography: | ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 23 |
ISSN: | 0195-6108 1936-959X |
DOI: | 10.3174/ajnr.A7476 |