On the characterisation of a Bragg spectrometer with X-rays from an ECR source

• Published in: Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment Vol. 545; no. 1; pp. 217 - 224
• Main Authors: Anagnostopoulos, D.F., Biri, S., Gotta, D., Gruber, A., Indelicato, P., Leoni, B., Fuhrmann, H., Simons, L.M., Stingelin, L., Wasser, A., Zmeskal, J.
• Format: Journal Article
• Language: English
• Published: Elsevier B.V 11.06.2005; Elsevier
• Subjects: Atomic Physics; ECR source; Exotic atoms; Physics; X-ray spectroscopy; Exotic atoms; 29.25.Ni; X-ray spectroscopy; ECR source; 36.10.−k; 29.30.Kv; ECRIS; spherically bent crystal; X-ray spectrometer; ray-tracing; Helium-like Argon
• ISSN: 0168-9002; 1872-9576
• DOI: 10.1016/j.nima.2005.01.311

Narrow X-ray lines from helium-like argon emitted from a dedicated ECR source have been used to determine the response function of a Bragg crystal spectrometer equipped with large area spherically bent silicon (1 1 1) or quartz ( 1 0 1 ¯ ) crystals. The measured spectra are compared with simulated ones created by a ray-tracing code based on the expected theoretical crystal's rocking curve and the geometry of the experimental set-up.