Understanding Cosmological Measurements with a large number of mock galaxy catalogues

Mock galaxy catalogues are essential to the error analysis of cosmological measurements from big galaxy surveys covering thousands of square degrees in the sky, like BOSS, WiggleZ, DES, or Euclid. The PTHalos mock galaxy catalogues were used in the BOSS survey to analyse the BAO measurement from the...

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Published inProceedings of the International Astronomical Union Vol. 10; no. S306; pp. 266 - 268
Main Authors Manera, M., Percival, W. J., Ross, Ashley, Tojeiro, R., Samushia, L., Howlett, C., Vargas-Magaña, M., Burden, A.
Format Journal Article
LanguageEnglish
Published Cambridge, UK Cambridge University Press 01.05.2014
Subjects
Astronomical bodies
Astronomy
Catalogues
Contributed Papers
Cosmology
Covering
Error analysis
Estimates
Red shift
Sky
Statistical methods
Surveys
Universe
statistical
cosmology: large scale structure of the universe
distance scale
methods: simulations
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Summary:Mock galaxy catalogues are essential to the error analysis of cosmological measurements from big galaxy surveys covering thousands of square degrees in the sky, like BOSS, WiggleZ, DES, or Euclid. The PTHalos mock galaxy catalogues were used in the BOSS survey to analyse the BAO measurement from the CMASS (z∼ 0.57) and LOWZ (z∼ 0.32) galaxy samples, which provided the best estimate to date of the cosmic distance scale from galaxy surveys at these redshifts. We review the PTHalos mocks galaxy catalogues and their key contributions to these analyses.
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ISSN:1743-9213
1743-9221
DOI:10.1017/S1743921314013738