Defect mode in periodic and quasiperiodic one-dimensional photonic structures

• Published in: Journal of materials science. Materials in electronics Vol. 20; no. Suppl 1; pp. 153 - 158
• Main Authors: Abdel-Rahman, Ehab, Shaarawi, Amr
• Format: Journal Article Conference Proceeding
• Language: English
• Published: Boston Springer US 2009; Springer; Springer Nature B.V
• Subjects: A defects; Applied sciences; Characterization and Evaluation of Materials; Chemistry and Materials Science; Circuit properties; Crystal defects; Defects; Devices; Electric, optical and optoelectronic circuits; Electronics; Exact sciences and technology; Fundamental areas of phenomenology (including applications); Integrated optics. Optical fibers and wave guides; Materials; Materials Science; Optical and Electronic Materials; Optical and optoelectronic circuits; Optical materials; Optics; Photonic bandgap materials; Photonic crystals; Photonics; Physics; Quality factor; Refractivity; Refractive Index; Defect Mode; Photonic Crystal; Defect Layer; Photonic Structure; Thickness; Integrated optics; Transfer matrix method; Q factor; Crystal defect; Photonic crystal
• ISSN: 0957-4522; 1573-482X
• DOI: 10.1007/s10854-007-9496-x

The properties of one-dimensional periodic and quasiperiodic photonic crystals with a defect layer have been investigated. Transfer matrix method (TMM) has been used throughout this study. For periodic photonic crystals, results demonstrate the independence of the defect mode frequency on the defect layer while the defect mode transmission coefficient varies with the position of the defect layer position. On the other hand, defect mode frequency is not that responsive to the index of refraction of the defect layer. The quality factor of the defect mode has been studied as a function of the defect layer position as well as its thickness. For quasiperiodic photonic crystals, the frequency of the defect mode is very sensitive to the defect layer position as well as its thickness. An enhancement of the quality factor of the defect mode has been observed. This study may be valuable in designing optical devices and it may also provide a more accurate method to measure the index of refraction.