The structural characterization of Co-Cu(100) superlattices by X-ray absorption spectroscopy

• Published in: Journal of physics. Condensed matter Vol. 6; no. 27; pp. 4981 - 4990
• Main Authors: Castaner, R, Prieto, C, Andres, A de, Martinez, J L, Martinez-Albertos, J L, Ocal, C, Miranda, R
• Format: Journal Article
• Language: English
• Published: Bristol IOP Publishing 04.07.1994; Institute of Physics
• Subjects: Applied sciences; Condensed matter: structure, mechanical and thermal properties; Exact sciences and technology; Low-dimensional structures (superlattices, quantum well structures, multilayers): structure, and nonelectronic properties; Metals. Metallurgy; Physics; Structure of solids and liquids; crystallography; Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties); X-ray absorption spectroscopy: exafs, nexafs, xanes, etc; X-ray diffraction and scattering; FCC lattices; Lattice distortion; XANES; Transition elements; Superlattices; Copper; Experimental study; Cobalt; EXAFS
• ISSN: 0953-8984; 1361-648X
• DOI: 10.1088/0953-8984/6/27/007

Extended X-ray absorption fine structure has been used to determine a crystallographic distortion in the cobalt layers in Co-Cu single-crystal superlattices grown on Cu(100). The fcc structure of the superlattice imposed by the copper substrate is distorted along the growing direction for the Co layers, which are compressed perpendicularly to the interfaces. They adopt the in-plane lattice constant of the Cu substrate, keeping constant the atomic volume of Co (11.30 Angstrom exp 3 /atom), close to the value for hcp-Co.