Bin mode estimation methods for Compton camera imaging

We study the image reconstruction problem of a Compton camera which consists of semiconductor detectors. The image reconstruction is formulated as a statistical estimation problem. We employ a bin-mode estimation (BME) and extend an existing framework to a Compton camera with multiple scatterers and...

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Bibliographic Details
Published inNuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment Vol. 760; pp. 46 - 56
Main Authors Ikeda, S., Odaka, H., Uemura, M., Takahashi, T., Watanabe, S., Takeda, S.
Format Journal Article
LanguageEnglish
Published Elsevier B.V 01.10.2014
Subjects
Accelerators
Algorithms
Cameras
Compton camera
Computer simulation
Detectors
Elastic scattering
Expectation maximization
Image reconstruction
Maximum a posteriori estimation
Maximum likelihood estimation
Semiconductors
Maximum a posteriori estimation
Expectation maximization
Maximum likelihood estimation
Compton camera
Image reconstruction
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ISSN0168-9002
1872-9576
DOI10.1016/j.nima.2014.05.081

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Summary:We study the image reconstruction problem of a Compton camera which consists of semiconductor detectors. The image reconstruction is formulated as a statistical estimation problem. We employ a bin-mode estimation (BME) and extend an existing framework to a Compton camera with multiple scatterers and absorbers. Two estimation algorithms are proposed: an accelerated EM algorithm for the maximum likelihood estimation (MLE) and a modified EM algorithm for the maximum a posteriori (MAP) estimation. Numerical simulations demonstrate the potential of the proposed methods.
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ISSN:0168-9002
1872-9576
DOI:10.1016/j.nima.2014.05.081