Design and Characterization of Fabry–Pérot MEMS-Based Short-Wave Infrared Microspectrometers
Microspectrometers based on the monolithic integration of a microelectromechanical system (MEMS) Fabry–Pérot filter and a Hg x Cd 1– x Te-based infrared detector are discussed and measured results presented. The microspectrometers are designed to operate in the 1.5 μ m to 2.6 μ m wavelength range....
Saved in:
Published in | Journal of electronic materials Vol. 37; no. 12; pp. 1811 - 1820 |
---|---|
Main Authors | , , , , , , , , , , , |
Format | Journal Article |
Language | English |
Published |
Boston
Springer US
01.12.2008
Springer Springer Nature B.V |
Subjects | |
Online Access | Get full text |
Cover
Loading…
Summary: | Microspectrometers based on the monolithic integration of a microelectromechanical system (MEMS) Fabry–Pérot filter and a Hg
x
Cd
1–
x
Te-based infrared detector are discussed and measured results presented. The microspectrometers are designed to operate in the 1.5
μ
m to 2.6
μ
m wavelength range. Design equations are presented which account for the mechanical and optical characteristics of the device. Measurements indicate linewidths as narrow as 55 nm, switching times of 40
μ
s, and a tuning range of 380 nm, which is limited by snap-down. Optical characterization of the distributed Bragg mirrors and the Fabry–Pérot filter are presented, and these are shown to be in good agreement with simple first-order analytical models. Bowing of the movable Fabry–Pérot mirror due to stress gradients is identified as the dominant source of linewidth broadening. |
---|---|
Bibliography: | ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23 |
ISSN: | 0361-5235 1543-186X |
DOI: | 10.1007/s11664-008-0526-0 |