Design and Characterization of Fabry–Pérot MEMS-Based Short-Wave Infrared Microspectrometers

Microspectrometers based on the monolithic integration of a microelectromechanical system (MEMS) Fabry–Pérot filter and a Hg x Cd 1– x Te-based infrared detector are discussed and measured results presented. The microspectrometers are designed to operate in the 1.5  μ m to 2.6  μ m wavelength range....

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Published inJournal of electronic materials Vol. 37; no. 12; pp. 1811 - 1820
Main Authors Keating, A.J., Antoszewski, J., Silva, K.K.M.B.D., Winchester, K.J., Nguyen, T., Dell, J.M., Musca, C.A., Faraone, L., Mitra, P., Beck, J.D., Skokan, M.R., Robinson, J.E.
Format Journal Article
LanguageEnglish
Published Boston Springer US 01.12.2008
Springer
Springer Nature B.V
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Summary:Microspectrometers based on the monolithic integration of a microelectromechanical system (MEMS) Fabry–Pérot filter and a Hg x Cd 1– x Te-based infrared detector are discussed and measured results presented. The microspectrometers are designed to operate in the 1.5  μ m to 2.6  μ m wavelength range. Design equations are presented which account for the mechanical and optical characteristics of the device. Measurements indicate linewidths as narrow as 55 nm, switching times of 40  μ s, and a tuning range of 380 nm, which is limited by snap-down. Optical characterization of the distributed Bragg mirrors and the Fabry–Pérot filter are presented, and these are shown to be in good agreement with simple first-order analytical models. Bowing of the movable Fabry–Pérot mirror due to stress gradients is identified as the dominant source of linewidth broadening.
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ISSN:0361-5235
1543-186X
DOI:10.1007/s11664-008-0526-0