Pulse shape analysis for electron mobility study in cadmium zinc telluride gamma-ray detectors

• Published in: IEEE transactions on nuclear science Vol. 51; no. 3; pp. 1166 - 1171
• Main Authors: Mengesha, W., Aalseth, C.E., Barnett, D.S., Bliss, M., Schaefer, C.
• Format: Journal Article
• Language: English
• Published: New York IEEE 01.06.2004; The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
• Subjects: Cadmium compounds; Cadmium zinc tellurides; CAMAC; CDTE SEMICONDUCTOR DETECTORS; Consistency; CZT; Data analysis; Data mining; Detectors; ELECTRON MOBILITY; GAMMA DETECTION; Gamma ray detectors; Instrumentation; INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; Instruments; Inverse; PULSE RISE TIME; Pulse shape; PULSE SHAPERS; Pulse shaping methods; Shape; Zinc compounds; ZINC TELLURIDES
• ISSN: 0018-9499; 1558-1578
• DOI: 10.1109/TNS.2004.829650

A pulse shape analysis technique was implemented to determine the electron mobility /spl mu//sub e/ and the electron mobility lifetime product /spl mu//sub e//spl tau//sub e/ in cadmium zinc telluride detectors (CZT). The digital gamma finder (DGF-4C) a single-width CAMAC module produced by X-Ray Instrumentation Associates (XIA), was used to extract pulse height, pulse shape, and signal rise time information. Data analyses using the extracted information allowed measuring the /spl mu//sub e/ and /spl mu//sub e//spl tau//sub e/ in selected CZT samples. An almost linear relationship was observed for the signal rise time as a function of the inverse bias. This observed linear relationship was the basis for determination of /spl mu//sub e/ using a simple linear fit. The measured signal amplitude was also used to determine /spl mu//sub e//spl tau//sub e/ using the Hecht formulation. Repeated measurements confirmed the consistency of the method in determining /spl mu//sub e/ and /spl mu//sub e//spl tau//sub e/.