Review on physical models of lunar brightness temperature
Brightness temperature is a main index to reflect the energy of microwave radiation of an object. Using lunar brightness temperature data, physical properties of lunar regolith, such as thickness, heat flow and dielectric permittivity, could be interpreted. There are two methods to study brightness...
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Published in | Acta geochimica Vol. 29; no. 2; pp. 204 - 211 |
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Main Authors | , , , , |
Format | Journal Article |
Language | English |
Published |
Heidelberg
SP Science Press
01.06.2010
Springer Nature B.V Graduate University of the Chinese Academy of Sciences, Beijing 100049, China%National Astronomical Observatories, Chinese Academy of Sciences, Beijing 100012, China National Astronomical Observatories, Chinese Academy of Sciences, Beijing 100012, China |
Subjects | |
Online Access | Get full text |
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Summary: | Brightness temperature is a main index to reflect the energy of microwave radiation of an object. Using lunar brightness temperature data, physical properties of lunar regolith, such as thickness, heat flow and dielectric permittivity, could be interpreted. There are two methods to study brightness temperature distribution of the moon: the first is used to measure lunar brightness temperature by radio observation or spaceborne microwave radiometers, and the second is used to simulate calculation by the physical model On the basis of the measurements of lunar brightness temperature in the history, this study analyzed the main physical model of lunar brightness temperature, also including its theory and influence factors. The authors concluded that surface and subsurface temperatures of the moon, dielectric properties and layered structure of lunar regolith were the main factors affecting the global brightness temperature of the moon. These factors should be quantified in detail in the future research. |
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Bibliography: | moon brightness temperature lunar regolith; brightness temperature; physical model; moon 52-1043/P O4-4 lunar regolith physical model TP722.6 |
ISSN: | 1000-9426 2096-0956 1993-0364 2365-7499 |
DOI: | 10.1007/s11631-010-0204-9 |