Review on physical models of lunar brightness temperature

Brightness temperature is a main index to reflect the energy of microwave radiation of an object. Using lunar brightness temperature data, physical properties of lunar regolith, such as thickness, heat flow and dielectric permittivity, could be interpreted. There are two methods to study brightness...

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Bibliographic Details
Published inActa geochimica Vol. 29; no. 2; pp. 204 - 211
Main Authors Feng, Jianqing, Zou, Yongliao, Bian, Wei, Zheng, Yongchun, Li, Chunlai
Format Journal Article
LanguageEnglish
Published Heidelberg SP Science Press 01.06.2010
Springer Nature B.V
Graduate University of the Chinese Academy of Sciences, Beijing 100049, China%National Astronomical Observatories, Chinese Academy of Sciences, Beijing 100012, China
National Astronomical Observatories, Chinese Academy of Sciences, Beijing 100012, China
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Summary:Brightness temperature is a main index to reflect the energy of microwave radiation of an object. Using lunar brightness temperature data, physical properties of lunar regolith, such as thickness, heat flow and dielectric permittivity, could be interpreted. There are two methods to study brightness temperature distribution of the moon: the first is used to measure lunar brightness temperature by radio observation or spaceborne microwave radiometers, and the second is used to simulate calculation by the physical model On the basis of the measurements of lunar brightness temperature in the history, this study analyzed the main physical model of lunar brightness temperature, also including its theory and influence factors. The authors concluded that surface and subsurface temperatures of the moon, dielectric properties and layered structure of lunar regolith were the main factors affecting the global brightness temperature of the moon. These factors should be quantified in detail in the future research.
Bibliography:moon
brightness temperature
lunar regolith; brightness temperature; physical model; moon
52-1043/P
O4-4
lunar regolith
physical model
TP722.6
ISSN:1000-9426
2096-0956
1993-0364
2365-7499
DOI:10.1007/s11631-010-0204-9