Service performance of nanopins based on branched carbon nanotubes

• Published in: Micro & nano letters Vol. 12; no. 12; pp. 934 - 939
• Main Authors: Zhang, Zhong-Qiang, Zhong, Jun, Liu, Zhen, Cheng, Guang-Gui, Ding, Jian-Ning
• Format: Journal Article
• Language: English
• Published: Stevenage The Institution of Engineering and Technology 01.12.2017; John Wiley & Sons, Inc
• Subjects: 45° V‐type CNT; 45° Y‐type CNT; 90° Y‐type CNT; branched carbon nanotubes; Carbon nanotubes; classical molecular dynamics simulations; installation; installation resistance; Molecular dynamics; molecular dynamics method; nanopins; Nanotubes; pushing approach; service performance; Silicon; silicon hole; T‐type CNT; unloading force; service performance; C; branched carbon nanotubes; T-type CNT; 45° Y-type CNT; installation resistance; silicon hole; 90° Y-type CNT; nanopins; carbon nanotubes; unloading force; classical molecular dynamics simulations; pushing approach; installation; molecular dynamics method; 45° V-type CNT
• ISSN: 1750-0443; 1750-0443
• DOI: 10.1049/mnl.2017.0188

Service performance of nanopins based on different branched carbon nanotubes (CNTs) including the 45° Y-type CNT, the 45° V-type CNT, the 90° Y-type CNT, and the T-type CNT have been investigated using classical molecular dynamics simulations. The Y-type CNT is the most cost-effective while there is adequate room to improve its service performance. The installed V-type CNT always has a trend of leaving from the silicon hole, and thus it would better be used with another nanopin cooperatively. For the 90° Y-type CNT, the installation resistance and the unloading force are almost in the same order of magnitude while the installation in pushing approach is relatively easier than that in pulling approach. Interestingly, the attraction between the silicon hole and the T-type CNT can mislead the branch, resulting in the failed installation of the T-type CNT consequently.