A study on segregation layers of Bi4Si3O12 crystal grown by the Bridgman method

Bismuth silicate (Bi4Si3O12, BSO) crystals including and excluding segregation layers have been grown by the Bridgman method. The morphology and composition of segregation layers existing in the defective crystal were investigated, and the crystallization habit of BSO crystal was discussed. In order...

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Bibliographic Details
Published inJournal of crystal growth Vol. 377; pp. 160 - 163
Main Authors Xiong, Wei, Zhou, Yao, Guo, Feiyun, Chen, Liang, Luo, Caiyun, Yuan, Hui
Format Journal Article
LanguageEnglish
Published Amsterdam Elsevier B.V 15.08.2013
Elsevier
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Summary:Bismuth silicate (Bi4Si3O12, BSO) crystals including and excluding segregation layers have been grown by the Bridgman method. The morphology and composition of segregation layers existing in the defective crystal were investigated, and the crystallization habit of BSO crystal was discussed. In order to grow large size BSO crystals, several growth techniques were suggested to restrain the segregation layers. The optical properties including transmittance, photoluminescence, X-ray excited luminescence spectra and light yield of BSO crystal were also measured and discussed in this paper. •Transparent Bi4Si3O12 crystal with a size of Φ25×100mm3 was grown by the Bridgman method.•Segregation layers observed in Bi4Si3O12 crystal present the features of growth facets.•Segregation layers seriously decrease the scintillation properties of Bi4Si3O12 crystal.•Suitable growth directions and slight Bi-rich melt are helpful to reduce segregation layers.
Bibliography:ObjectType-Article-1
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content type line 23
ISSN:0022-0248
1873-5002
DOI:10.1016/j.jcrysgro.2013.04.047